JPH0322582B2 - - Google Patents

Info

Publication number
JPH0322582B2
JPH0322582B2 JP55164463A JP16446380A JPH0322582B2 JP H0322582 B2 JPH0322582 B2 JP H0322582B2 JP 55164463 A JP55164463 A JP 55164463A JP 16446380 A JP16446380 A JP 16446380A JP H0322582 B2 JPH0322582 B2 JP H0322582B2
Authority
JP
Japan
Prior art keywords
ray
sample
honeycomb
slit
rays
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP55164463A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5788355A (en
Inventor
Teruji Hirai
Masao Kawai
Gen Date
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP55164463A priority Critical patent/JPS5788355A/ja
Publication of JPS5788355A publication Critical patent/JPS5788355A/ja
Publication of JPH0322582B2 publication Critical patent/JPH0322582B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/316—Accessories, mechanical or electrical features collimators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G01N2223/501—Detectors array

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP55164463A 1980-11-21 1980-11-21 Apparatus for x-ray analysis Granted JPS5788355A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55164463A JPS5788355A (en) 1980-11-21 1980-11-21 Apparatus for x-ray analysis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55164463A JPS5788355A (en) 1980-11-21 1980-11-21 Apparatus for x-ray analysis

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP1161229A Division JPH02132352A (ja) 1989-06-23 1989-06-23 Ｘ線分析装置

Publications (2)

Publication Number Publication Date
JPS5788355A JPS5788355A (en) 1982-06-02
JPH0322582B2 true JPH0322582B2 (en]) 1991-03-27

Family

ID=15793645

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55164463A Granted JPS5788355A (en) 1980-11-21 1980-11-21 Apparatus for x-ray analysis

Country Status (1)

Country Link
JP (1) JPS5788355A (en])

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE8305084L (sv) * 1983-09-21 1985-03-22 Asea Ab Sett for centrifugalgjutning
JPH01147352A (ja) * 1987-12-03 1989-06-09 Matsushita Electric Ind Co Ltd 元素分布度の評価方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5636394B2 (en]) * 1973-04-30 1981-08-24
JPS5724504B2 (en]) * 1974-02-28 1982-05-25
DE2622177A1 (de) * 1976-05-19 1977-12-01 Philips Patentverwaltung Anordnung zur ermittlung der absorption einer strahlung in einer ebene eines koerpers
JPS5328116A (en) * 1976-08-27 1978-03-16 Mitsubishi Chem Ind Ltd Preparation of glycine

Also Published As

Publication number Publication date
JPS5788355A (en) 1982-06-02

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